Equipment: General Electric, nanotom
Technique: Non-destructive failure analysis via XR-Computed Tomography (CT)
Description:
XR-CT is a non-destructive imaging method for the assessment of homogeneity, porosity, material phases, changes in microstructure after material ageing of single components or devices. A wide range of materials can be displayed, especially in a composite. In-situ analysis under thermal (-15°C to 140°C), mechanical or electrical stress are possible.
Specifications:
- 180 kV X-ray tube
- 3052 x 2400 area detector
- Voxel size to 5 µm
- 2D Radioscopy
- 3D Computed Tomography.