TA4. Characterization of prototypes and demonstrators

Equipment: Scanning Transmission Electron Microscope Technique:Scanning Transmission Electron Microscopy Contact Person: (UNINOVA): Ana Pimentel (acgp@fct.unl.pt) Description: The Hitachi HF5800 is a Scanning Transmission Electron...

Equipment: Profilometer – DEKTAK Brucker Technique: Profilometry Contact Person: (UNINOVA): Joana Vaz Pinto (jdvp@fct.unl.pt) Description: The DEKTAK Profilometer by Bruker is a high-precision contact...

Equipment: PalmSens 4 Technique: Potentiostat/Galvanostat Contact Person: (UNINOVA): Tomás Pinheiro (tp.pinheiro@campus.fct.unl.pt) Description: The PalmSens4 is a hand-held battery powered instrument for use with electrochemical...

Equipment: AFM – Park Systems FX40 Technique: Atomic Force Microscopy Contact Person: (UNINOVA): Tomás Calmeiro (t.calmeiro@fct.unl.pt) Description: An atomic force microscope is a type...

Equipment: WITec alpha300 R Technique: Confocal UV Raman Microscopy Description: The UV confocal Raman microscope is an advanced method to acquire chemical and phase...

Equipment: aixACCT TF Analyzer 3000 Technique: Static and dynamic electrical analysis Description: FE module: Standard measurements on ferroelectric materials and it consists of a...

Equipment: XYZTec, Sigma Conder Bondtester Technique: Static mechanical tests Description: Different mechanical load possibilities like 3- and 4-point bending applications, pull, peel and shear...

Equipment: General Electric, nanotom Technique: Wire bonding for chip, sensor interconnects Description: Ball-wedge bonding for 25 µm Au and Al wire connections for chips,...

Equipment: General Electric, nanotom Technique: Non-destructive failure analysis via XR-Computed Tomography (CT) Description: XR-CT is a non-destructive imaging method for the assessment of homogeneity,...

Equipment: HCMS Technique: Advanced material characterization under controlled humidity conditions Description: The Humidity-Controlled Measurement System (HCMS) is designed for advanced material characterization under controlled...

Technique: High Precision, Piezoelectric d33 Testing System Acquisition year: 2019 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Martin Zirkl  (martin.zirkl@joanneum.at) Description: The system works by...

Technique: Atomic Force Microscopy Acquisition year: 2023 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Oliver Werzer (oliver.werzer@joanneum.at) Description: The Asylum Research Jupiter XR Atomic Force...