Equipment: Bruker B8 Insitu-GIWAXS
Technique: Grazing incidence X-ray diffraction
Contact person (Technische Universität Dresden): Ali Shaygan Nia (ali.shaygan_nia@tu-dresden.de), Hans Kleemann (hans.kleemann1@tu-dresden.de)
Responsible: Martin Kroll (Martin.kroll@tu-dresden.de)
Description: State-of-the-Art X-Ray diffraction system (Bragg-Brentano geometry) and gracing incidence driffaction. 2D Detector (Lyx-Eye). Special chamber for insitu measurement (temperature range RT…400°C), inert loading.
Specifications:
- flexible in terms of sample size+
- ideal for rapid characterization in preparation for synchrotron
- Cu-cathode
- Detector Lyx-Eye
- Several nozzles for beam projection (choice of area of interest)
