Equipment: Combiscope
Technique: Atomic force microscopy (AFM)
Contact person (Technische Universität Dresden): Ali Shaygan Nia (ali.shaygan_nia@tu-dresden.de), Hans Kleemann (hans.kleemann1@tu-dresden.de)
Responsible: Ran Ji (Ran.Ji@tu-dresden.de)
Description: Multi-function AFM (contact, tapping, surface conductivity, ..). Equipped with microscope system to position sample precisely but also to optically excite sample (photoconductivity).
Specifications:
- Excitation wavelenght 532, 635, 405nm and 1300
- Various kind of AFM tips available
