Wishlist

Equipment: Combiscope
Technique:  Atomic force microscope
Acquisition year: 2002
Responsible: Ran Ji /

Description: Multi-function AFM (contact, tapping, surface conductivity, ..). Equipped with microscope system to position sample precisely but also to optically excite sample (photoconductivity).

Specifications: 

  • Excitation wavelenght 532, 635, 405nm and 1300
  • Various kind of AFM tips available