Equipment: Combiscope
Technique: Atomic force microscope
Acquisition year: 2002
Responsible: Ran Ji /
Description: Multi-function AFM (contact, tapping, surface conductivity, ..). Equipped with microscope system to position sample precisely but also to optically excite sample (photoconductivity).
Specifications:
- Excitation wavelenght 532, 635, 405nm and 1300
- Various kind of AFM tips available
