Equipment: Ecopia HMS-3000
Technique: Van Der Pauw Method
Contact person (Hellenic Mediterranean University): Konstantinos Rogdakis (krogdakis@hmu.gr)
Description: The HMS-3000 Hall Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors using the Van Der Pauw method.
Specifications:
- Maximum sample size (Small board) – 6mm x 6mm, (Large Board/Spring Clip Board) – 20mm x 20mm.
- Measurement Temperature: 300K (room temperature), 77K (Liquid Nitrogen).
- Cool-down time: 10sec.
- Measurement Material: All semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured).
- Data input of depth enables comprehensive measurement of the whole material.
- Resistivity Range of HMS-3000: 10-4 to 107 (Ohms-cm).
- Magnet: Permanent magnet (diameter: 50mm).
- Magnet Flux Density: 0.51 Tesla nominal +/-1% of marked value (Optional 1 Tesla sample kit for 300K testing only)
- Stability: 2% over 1 years.
- Uniformity: +/- 1% over 20mm diameter from center.
- Pole Gap: 26 mm.
- Hall voltage range: 1uV to 2000mV.
