Equipment: Phoibos 100, Specs
Technique: Ultraviolet and X-ray photoelectron spectroscopy
Contact person (Technische Universität Dresden): Ali Shaygan Nia (ali.shaygan_nia@tu-dresden.de), Hans Kleemann (hans.kleemann1@tu-dresden.de)
Responsible: Carsten Habenicht (Carsten.habenicht@tu-dresden.de)
Description: UPS (ultraviolet photoelectron spectroscopy) can measure HOMO position, ionization potential and vacuum level of metals and semiconducting materials. XPS (x-ray photoelectron spectroscopy) can measure core level shifts and elementary composition of surfaces. Possible to heat (tungsten wire) and cool (N2) the sampleholders during measurement
Specifications:
- Custom-made sample holder
- samples on Au or Ag foil
- Sputter system to clean surfaces
- He 21.2eV source
- Al cathode for X-ray
- Measurement in UHV (10e-11mbar)
- Software for peak fitting and database for material composition determination
