Equipment: Profilometer – DEKTAK Brucker
Technique: Profilometry
Contact Person: (UNINOVA): Joana Vaz Pinto (jdvp@fct.unl.pt)
Description:
The DEKTAK Profilometer by Bruker is a high-precision contact surface profiler used to measure the topography and thickness of thin films and coatings at the nanoscale. It works by scanning a diamond stylus across the sample surface, recording height variations, and generating a 3D surface profile.
Specifications:
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Vertical Measurement Range: Up to 1 mm for general profiling (depending on the model).
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Horizontal Measurement Range: Typically up to 200 mm (with larger stages for extended measurements).
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Vertical Resolution: Sub-nanometer resolution (typically around 0.1 nm).
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Horizontal Resolution: Can achieve sub-micron resolution depending on the stylus tip
