Technique: Thermal Interface Material Analyzer (TIMA 5)
Acquisition year: 2024
Contact person (RISE): Yusuf Mulla (yusuf.mulla@ri.se)
Responsible: Ioannis Petsagkourakis (ioannis.petsagkourakis@ri.se)
Description:
A system for thermal and thermo-mechanical characterization of thermal interface materials as well as other material classes with low to medium thermal conductivities. It complies with ASTM D5470 standard.
It is used to obtain:
- Thermal interface resistance
- Pressure and temperature dependency
- Effective and bulk thermal conductivity
- Overall thermal resistance
Specifications:
- Category: Thermal material characterization
- Standard: ASTM D5470
- Target: Thermal interface material – Pastes, Phase change materials, thin and thick substrates upto 1cm
- Limit: 1 mm² K/W
- Samples size: 1 cm diameter maximum.
- Sample temperature: upto 150 Deg C.
- Force: ± 300 N clamping and tensile force with integrated load cell
- Force measurement resolution: ~0.1 N and control can be around 1N force.
Parameter analyser:
- Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA – 1 A / 0.5 µV – 200 V
- Advanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)
- Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
- EasyEXPERT group + software
Link for additional information:
https://nanotest.eu/tima
