Description: The 3D laser scanning microscope of the VK-X1050 model series uses two different measurement principles combined in one device; depending on the application, a confocal laser and focus variation can be used. This enables high-precision measurements and analysis of various measurement objects with nanometer resolution.
Specifications: A fast acquisition of measurement areas up to 100 × 100 mm, with a maximum sample sizes upto 630 x 300 mm. This enables fast analysis of both the overall shape and specific areas. Even difficult materials, such as those with transparent and reflective surfaces, can be measured quickly, with high accuracy, and over large areas. This 3D laser scanning microscope can measure objects regardless of magnification, surface roughness and texture (transparent/reflective surfaces).
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