Joanneum Research (JOR)

The JEOL JSM-IT 100 is a compact SEM designed for fast imaging. In SEM a cathode ray focused to nm size is scanned over...

Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer.

Electron beam lithography (EBL) is a method for creating ultra-fine, nanometer-sized structures in modern nanotechnology. It is an important instrument in semiconductor technology, used...

This setups allows for calibrated, reproducible measurements to evaluate the performance of ferroelectric sensors including hysteresis poling thereof.

XPS is a surface sensitive method for chemical analysis widely used for e. g.  thin films, molecular layers or chemical surface modification. The sample...

The 3D laser scanning microscope of the VK-X1050 model series uses two different measurement principles combined in one device; depending on the application, a...

Spectroscopic ellipsometry is an optical technique using the relative phase and amplitude changes in polarized light reflected from a surface or a thin film...

Mid infrared FTIR spectrometer which allows for a spectroscopic analysis of samples in the mid-infrared range. In this wavelength range, organic samples typically have...

Ultramicrotomy is used to create cross-sections of materials or layer systems for a quick and reliable quality assessment.

The laboratory Screen printer 1000 is used exclusively for printing rigid and flexible materials in the format 400 x 400 mm and a maximum...

The Aerosol Jet technology enables printing of functional inks on both 2D and 3D substrates. The process supports a wide range of functional inks,...

The Electrostatic Jet printer (ESJET) is a high-resolution digital printing technology. It uses high voltages that, when applied to a fluid (ink) in short...