Joanneum Research (JOR)

Technique: High Precision, Piezoelectric d33 Testing System Acquisition year: 2019 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Martin Zirkl  (martin.zirkl@joanneum.at) Description: The system works by...

Technique: Atomic Force Microscopy Acquisition year: 2023 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Oliver Werzer (oliver.werzer@joanneum.at) Description: The Asylum Research Jupiter XR Atomic Force...

Technique: Heating-Cooling stage Acquisition year: unknown Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Martin Zirkl (martin.zirkl@joanneum.at) Description: The system consists of a LTS350 stage, a...

Technique: tensile/compression testing (force & displacement measurement) Acquisition year: 2017 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Johannes Götz (johannes.goetz@joanneum.at) Description: The single-column testing system...

Technique: Monitoring flow rates in microfluidic systems Acquisition year: 2022 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Laura Angermann-Krammer (laura.angermann-krammer@joanneum.at) Description: Fluigent’s Microfluidic Flow Sensor is a unique...

Technique:  Rheology Acquisition year: 2007 Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at) Responsible: Paul Patter (paul.patter@joanneum.at) Description: The Brookfield DV-III Ultra Programmable Rheometer measures fluid parameters...

The JEOL JSM-IT 100 is a compact SEM designed for fast imaging. In SEM a cathode ray focused to nm size is scanned over...

Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer.

Electron beam lithography (EBL) is a method for creating ultra-fine, nanometer-sized structures in modern nanotechnology. It is an important instrument in semiconductor technology, used...

This setups allows for calibrated, reproducible measurements to evaluate the performance of ferroelectric sensors including hysteresis poling thereof.

XPS is a surface sensitive method for chemical analysis widely used for e. g.  thin films, molecular layers or chemical surface modification. The sample...

The 3D laser scanning microscope of the VK-X1050 model series uses two different measurement principles combined in one device; depending on the application, a...