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Oxford instruments/Jupiter XR

Country/Institute
Austria • Joanneum Research (JOR)

Technique: Atomic Force Microscopy

Acquisition year: 2023

Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at)

Responsible: Oliver Werzer (oliver.werzer@joanneum.at)

Description:

The Asylum Research Jupiter XR Atomic Force Microscope is a large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results and a simpler user experience. Besides standard topography imaging, it offers advanced modes for nanomechanic and nanoelectric characterization such as KPFM, conductive AFM, SCM, EFM, PFM, MFM and force mapping.

Specifications:

  • Any point on 200 mm samples fully-addressable with high-speed stage (200 mm x 300 mm  travel)
  • Max. sample height: 35 mm
  • Scanner: 100 μm X-Y & 12 μm Z range
  • Typical image acquisition time (topography): 1 min/frame
  • Measurement in inert atmosphere or liquids possible
  • Active sample cooling/heating from -30°C up to 120°C or from RT to 300°C (passive cooling) for up to 20 mm samples
  • High voltage manipulation with up to +/- 150 V possible
  • I/V measurements with a current gain of up to 1e9 V/A
  • BlueDrive™ Tapping Mode for more reproducible results and simplified operation
  • Ultralow noise floor (< 25pm)

Link for additional information:

https://afm.oxinst.com/products/jupiter-family-of-afms/jupiter-xr-afm