Technique: Atomic Force Microscopy
Acquisition year: 2023
Contact person (Joanneum Research): Barbara Stadlober (barbara.stadlober@joanneum.at)
Responsible: Oliver Werzer (oliver.werzer@joanneum.at)
Description:
The Asylum Research Jupiter XR Atomic Force Microscope is a large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results and a simpler user experience. Besides standard topography imaging, it offers advanced modes for nanomechanic and nanoelectric characterization such as KPFM, conductive AFM, SCM, EFM, PFM, MFM and force mapping.
Specifications:
- Any point on 200 mm samples fully-addressable with high-speed stage (200 mm x 300 mm travel)
- Max. sample height: 35 mm
- Scanner: 100 μm X-Y & 12 μm Z range
- Typical image acquisition time (topography): 1 min/frame
- Measurement in inert atmosphere or liquids possible
- Active sample cooling/heating from -30°C up to 120°C or from RT to 300°C (passive cooling) for up to 20 mm samples
- High voltage manipulation with up to +/- 150 V possible
- I/V measurements with a current gain of up to 1e9 V/A
- BlueDrive™ Tapping Mode for more reproducible results and simplified operation
- Ultralow noise floor (< 25pm)
Link for additional information:
https://afm.oxinst.com/products/jupiter-family-of-afms/jupiter-xr-afm