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Veeco/Dimension 3100V

Country/Institute
Austria • Joanneum Research (JOR)

Equipment: Veeco/Bruker/ AFM Dimension 3100
Technique: Atomic Force Microscope
Acquisition year: ~1999
Responsible: Oliver Werzer /  

Description: Atomic Force Microscopy (AFM) is a high resolution scanning probe microscope with resolution on the order of sub nanometer. The AFM consist of a cantilever with a sharp tip used to scan the surface of a sample. The instrument is used for tapping or contact mode atomic force microscopy imaging.

Specifications: 

  • Sample size 150 mm diameter 12 mm thick;
  • Stage movement x-y 150 mm with 2 micron resolution;
  • Video optics with zoom 150-675 micron viewing area;
  • Piezo scan head range; 90 micron x-y and 6 micron in z;
  • 16 bits DAC giving sub nanometer resolution;
  • Max 512 x 512 samples/image;
  • Contact and tapping mode AFM, Conductive AFM;
  • Typical applications: Characterization of surface roughness, Step height and mapping of topography.