Equipment: AFM – Park Systems FX40
Technique: Atomic Force Microscopy
Contact Person: (UNINOVA): Tomás Calmeiro (t.calmeiro@fct.unl.pt)
Description:
An atomic force microscope is a type of microscope that maps sample properties by tracking the behaviour of a nanometre sized probe as it moves on a sample’s surface and interacts with it. The probe’s behaviour can then be translated into nanoscale images that combine topography with other properties, such as conductivity, contact potential difference, Young’s modulus, etc..
Specifications:
Besides contact and alternate contact (tapping) modes, there are modes and accessories for conductive AFM, Kelvin probe force microscopy (contact potential difference determination), scanning capacitance microscopy, scanning spreading resistance microscopy and fast force maps. Some of these modes of operation are compatible with acquisition in liquid media. Force spectroscopy is also available beyond standard force-distance curves, with possibility of feeding and measuring custom signals.
Scan limits are 100x100x6 µm, however, for optimal results, scan areas above 20×20 µm should be avoided and the height range of the sample should be kept at under 1/20 of the scan area side. Samples should be flat, under 2×2 cm and have a back contact for electrical applications, if desired. Resolution at optimal conditions is subnanometric at the XY axis and ~50 pm at the Z axis.
