Agilent 4155C + Everbeing C-2

Equipment: Agilent 4155C + Everbeing C-2
Technique: Semiconductor parameter analyser
Acquisition year: 2017
Responsible: Jorge Martins /

Description: Setup for I-V and time dependent measurements in substrates up to 2”, at room temperature, with dark box enclosure.


  • Dark box enclosure for light and RF shielding
  • 4x Source-Monitor Units (SMUs), 2x Voltage-Monitor Units (VMUs) and 2x Voltage-Source Units (VSUs). Measurement resolution of 10 fA. Range up to 100 V / 0.1 A
  • Sweep, constant and sampling mode I and V stimulus
  • 4 manual micromanipulators with triaxial cabling (sub-pA measurement capability)
  • Keysight Desktop EasyExpert software for data acquisition and analysis 
  • Can be connected to external equipment (e.g. oscilloscope and wave generator)
  • Time dependent measuring
  • 4 manual micromanipulators with triaxial cabling (sub-pA measurement capability)
  • Substrates up to 2”

Link for additional information (if any):