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Ambios XP200 Profiler

Equipment: Ambios XP200 Profiler
Technique: Profilometry
Acquisition year: 2008
Responsible: Joana Vaz Pinto /

Description: Profilometry is a fast and direct method for measuring step heights, surface roughness, etching depths and planarity.  A diamond stylus is placed in contact with a sample and moved laterally across the sample for a specified distance and contact force.   The height position of the diamond stylus generates an analogue signal which is converted into a digital signal stored, analysed and displayed. 

Specifications: 

  • Vertical range from 10 Å to 1.2 mm
  • Vertical resolution of 1 Å in the 2.5 µm range and 100 nm in the 1.2 mm range.
  • Maximum Scan length of 55 mm
  • Motorized and programmable stage positioning
  • Sample alignment through a Colour Camera with Zoom magnificationof 40X to 160X.
  • Standard stylus: diamond tip with 2.5 µm radius.
  • Programmable Stylus tracking force from 0.03 mgF to 10 mgF.
  • Programmable scan speed.
  • Automation routines included to allow step detection and profile substration
  • 3D surface mapping using TrueMap software

Samples: Maximum sample dimensions are 200 mm diameter and heights up to 55 mm.

Link for additional information (if any):
https://www.cenimat.fct.unl.pt/services/laboratory-electronic-and-optoelectronic-materials-and-devices/profilometer-ambios-xp-plus-200-stylus
http://mnm.physics.mcgill.ca/content/ambios-xp200-profiler