Equipment: Asylum Research (Oxford Instruments) MFP-3D Standalone
Technique: Atomic Force Microscopy (AFM)
Contact person (UNINOVA): Pedro Barquinha (firstname.lastname@example.org), Inês Cunha (email@example.com)
Responsible: Tomás Rosa Calmeiro (firstname.lastname@example.org)
Description: An atomic force microscope is a type of microscope that maps sample properties by tracking the behaviour of a nanometre sized probe as it moves on a sample’s surface and interacts with it. The probe’s behaviour can then be translated into nanoscale images that combine topography with other properties, such as conductivity, contact potential difference, Young’s modulus, etc..
Specifications: Besides contact and alternate contact (tapping) modes, there are modes and accessories for conductive AFM (ORCA module with ±10V applied bias range and 2 nA/V sensitivity), Kelvin probe force microscopy (contact potential difference determination), piezoresponse, lithography (localised anodic oxidation), contact mechanics (elastic properties) and liquid media operation studies. Force spectroscopy is also available beyond standard force-distance curves, with possibility of feeding and measuring custom signals.
Scan limits are 90x90x12 um, however, for optimal results, the height range of the sample should be kept at under 1/20 of the scan area side and the sample must be flat. Resolution at optimal conditions is ~0.5 nm at the XY axis and ~0.1 nm at the Z axis.
Samples should be under 5×5 cms and flat, a back contact should be present for electrical mode measurements.
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