Equipment: Hitachi TM3030 Plus
Technique: Scanning Electron Microscopy (SEM)
Contact person (UNINOVA): Pedro Barquinha (pmcb@fct.unl.pt), Inês Cunha (i.cunha@campus.fct.unl.pt)
Responsible: Daniela Gomes (daniela.gomes@fct.unl.pt)
Description: SEM tabletop microscope operating at 5 and 15 kV equipped with energy dispersive X-ray spectroscopy (EDS) detector.
Specifications:
- Acceleration voltages of 5 and 15 kV with magnifications of 15x to 60000x;
- Observation modes: BSE:Conductor/Standard/Charge-up Reduction;
SE:Standard/Charge-up Reduction;
Mix:Standard/Charge-up Reduction;
SIGNAL SELECTION: BSE/SE/Mix; - Maximum sample height: Up to 70mm in diameter and 50mm thickness.
Link for additional information: https://www.hitachi-hightech.com/file/us/pdf/library/literature/TM3030_brochure_letter.pdf
