SEM-FIB: Zeiss Auriga CrossBeam system

SEM-FIB: Zeiss Auriga CrossBeam system

Equipment: Zeiss Auriga Crossbeam
Technique: Scanning Electron Microscope (SEM)/ Focused Ion Beam (FIB)
Contact person (UNINOVA): Pedro Barquinha (pmcb@fct.unl.pt), Ana Rovisco (a.rovisco@fct.unl.pt)
Responsible: Pedro Barquinha (pmcb@fct.unl.pt)

Description: Zeiss Auriga combines a high-resolution SEM for imaging materials and devices at nanoscale with a FIB column enabling precise milling. The tool has multiple detectors including in-lens and out-lens SE and BSE, a large area EDS (150 mm2) and EBSD. It also has a gas injector system for localized deposition of materials. In-situ heating experiments and electrical characterization are also possible. Besides a wide range of nanoanalysis capabilities, the tool can also be used for TEM lamela preparation.


Main technical specifications

  • SEM column – Schottky Field Emitter, resolution of 1.0 nm @ 15 kV, 1.9 nm @ 1 kV, acceleration voltage between 0.1 and 30 kV
  • FIB column – Ga liquid metal ion source (LMIS), resolution <7 nm @ 30 kV, acceleration voltage between 1 and 30 kV, probe current between 1 pA and 50 nA
  • SE and EsB detectors – Everhart-Thornley type SE, In-lens SE and in-lens EsB. Mix-mode possible by tuning grid polarization of detectors
  • Large area EDS detector Oxford X-Max 150 with Aztec software for elemental and chemical analysis with high count rates and low beam current. Detection from beryllium (Be) to californium (Cf)
  • Microstructure characterization with Oxford Nordlys II-S EBSD, integrated with Aztec software
  • Gas injector system for SEM or FIB-assisted local deposition of C, Pt and SiO2, selective etching of dielectrics with XeF2, local charge compensation to reduce charging effects in non-conductive samples
  • Heating stage Kammrat & Weiss, for in-situ analysis under heating up to 1050 °C;
  • 4 Kleindiek nanotechnik nanomanipulators for electrical measurements of nanodevices and TEM lamela preparation
  • Load-lock chamber for fast and contamination free sample loading-unloading.

Type of samples

  • Protocols for preparation of multiple forms of solid samples available (bulk, powder, thin film…), including biological samples (after dehydration)
  • Sample size from few mm up to approx 2”.

Link for additional information: https://www.zeiss.com/microscopy/int/products/fib-sem-instruments/crossbeam.html