TA2.1. Materials characterization

Recycling preparative HPLC is a sepration technique that provides a fast and elegant approach to purify mg to gram quantities of starting materials, intermediates...

 Measurement of thin film, liquids, and solid samples over a wide range. TENSOR II provides outstanding performance for highest sensitivity.

Brunauer-Emmett-Teller (BET) surface areas analysis device explicitly used to elucidate intrinsic porosity as well as specific surface areas of the sample.

Brunauer-Emmett-Teller (BET) surface areas analysis device explicitly used to elucidate intrinsic porosity as well as specific surface areas of the sample.

The single quadrupole compact mass spectrometer (cms) by Advion offers polarity switching in a single analysis for a greater range of detectable ions.

The Bruker MultiMode 8 AFM provides nano-meter surface topography imaging and pico-Newtown surface force measurement in air.

SEM tabletop microscope operating at 5 and 15 kV equipped with energy dispersive X-ray spectroscopy (EDS) detector.

The UV confocal Raman microscope is an advanced method to acquire chemical and phase compositions, texture, phase transitions, residual stresses and structural information non-destructively...

X-ray diffraction is a non-destructive technique used for the identification and quantification of the crystalline phase composition of powdered, bulk, and thin film samples

An instrument for determining caloric effects (transformation temperatures and enthalpies) and mass change at the same time.

The TECAN SPARK 10M is a multifunctional microplate reader equipped with a high-speed monochromator (HSM), allowing full absorbance spectrum scan in less than 5...

Ellipsometry is based on the measurement of the light polarization change upon reflection from a sample surface or interface.