TA2.1. Materials characterization

Dynamic Light Scattering (DLS) is one of the most popular light scattering techniques because it allows particle sizing down to 1 nm diameter.

The LSM 700 is a light microscopy system that uses laser light in a confocal beam path to capture defined optical sections of the...

Brookfield's CAP-2000+ offers expanded temperature and viscosity ranges with variable speed capability. 

Profilometry is a fast and direct method for measuring step heights, surface roughness, etching depths and planarity.

An atomic force microscope is a type of microscope that maps sample properties by tracking the behaviour of a nanometre sized probe as it...

FTIR allows the determination of the molecular groups of all organic materials, and many inorganic materials.

The Lambda 950 is a UV/VIS/NIR high-performance double-beam dual monochromator spectrometer with microcomputer electronics.

Digital storage oscilloscope is an electronic device consisting of numerous software and electronic hardware modules that allow to capture, process, view, and store electrical signals

The Reference 600™ is a Potentiostat/Galvanostat/ZRA equipped with acquisition and analysis software for physical electrochemistry and electrochemical impedance experiments.

The PerkinElmer LS 55 Luminescence spectrometer offers flexibility, versatility, reliability and ease-of-use.

X-ray photoelectron spectroscopy is a surface analysis tool for chemical and electronic characterization of materials with an information depth of 1-9 nm.

Semiconductor parameter analyser for device/circuit characterization, supporting I-V, C-V, and time dependent measurements.