TA4.1. Device metrology & characterization

The ergonomic and modular Leica M80 routine stereo microscope with ESD design, large field of view, increased depth of focus and improved resolution easily...

The system is capable of measuring the spectral response and quantum efficiency of any kind of photovoltaic devices, such as single or multi junction...

High resolution field emission SEM microscope operating at up to 30 kV equipped with energy dispersive X-ray spectroscopy (EDS) detector, and reaching resolutions down...

The LSM 700 is a light microscopy system that uses laser light in a confocal beam path to capture defined optical sections of the...

Profilometry is a fast and direct method for measuring step heights, surface roughness, etching depths and planarity.

An atomic force microscope is a type of microscope that maps sample properties by tracking the behaviour of a nanometre sized probe as it...

The Lambda 950 is a UV/VIS/NIR high-performance double-beam dual monochromator spectrometer with microcomputer electronics.

Digital storage oscilloscope is an electronic device consisting of numerous software and electronic hardware modules that allow to capture, process, view, and store electrical signals

The Reference 600™ is a Potentiostat/Galvanostat/ZRA equipped with acquisition and analysis software for physical electrochemistry and electrochemical impedance experiments.

Semiconductor parameter analyser for device/circuit characterization, supporting I-V, C-V, and time dependent measurements.

Keysight 33500B is a Waveform Generator. It has two channels and allows for arbitrary waveform generation.  

Setup for I-V, C-V time dependent and pulsed-IV measurements in substrates up to 4” (2” max recommended), on cryogenic probe station with optical arm...