TA2.1. Materials characterization

Keysight 33500B is a Waveform Generator. It has two channels and allows for arbitrary waveform generation.  

Setup for I-V, C-V time dependent and pulsed-IV measurements in substrates up to 4” (2” max recommended), on cryogenic probe station with optical arm...

 A four-point-probe technique for measuring semiconductor resistivities, which is easy to implement, nondestructive, and especially convenient for probing the wafers used in device fabrication.

The OCA 15 is the R&D instrument for automated video contact angle metrology and drop shape analysis.

The HL5500PC is a high-performance Hall Effect Measurement System with a 0.5 T permanent magnet.

Setup for I-V and time dependent measurements in substrates up to 2”, at room temperature, with dark box enclosure.

Setup for I-V and time dependent measurements in substrates up to 6”, from room temperature to 300 °C, with dark box enclosure.

Zeiss Auriga combines a high-resolution SEM for imaging materials and devices at nanoscale with a FIB column enabling precise milling.

The HMS-3000 Hall Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors using the Van Der Pauw...

Atomic Force Microscope system for small and medium size samples, consisting of completely decoupled XY & Z scanners using flexure guided scan system for...

The APS04 system combines two different techniques: Ambient pressure Photoemission Spectroscopy (APS) (absolute work function Φ/IE/HOMO) and high-resolution Kelvin Probe KP.