TA4. Characterization of prototypes and demonstrators

The Reference 600™ is a Potentiostat/Galvanostat/ZRA equipped with acquisition and analysis software for physical electrochemistry and electrochemical impedance experiments.

Semiconductor parameter analyser for device/circuit characterization, supporting I-V, C-V, and time dependent measurements.

Keysight 33500B is a Waveform Generator. It has two channels and allows for arbitrary waveform generation.  

Setup for I-V, C-V time dependent and pulsed-IV measurements in substrates up to 4” (2” max recommended), on cryogenic probe station with optical arm...

Setup for I-V and time dependent measurements in substrates up to 2”, at room temperature, with dark box enclosure.

Setup for I-V and time dependent measurements in substrates up to 6”, from room temperature to 300 °C, with dark box enclosure.

Zeiss Auriga combines a high-resolution SEM for imaging materials and devices at nanoscale with a FIB column enabling precise milling.

Mechanical peel testing machine Mark-10 with a ESM303 test stand with a series 5 force gauge and G1008 film and paper grip.

Two available climate chambers for controlled humidity and temperature experimentation.

Customizable measurement setups for the characterization of electrochromic displays

Advanced equipment for electrical characterization of materials, components, devices and circuits in ESD protected area (EPA).

The Anton-Paar Rheometer is a quick and convenient method to measure the rheology of inks.