TA2.1. Materials characterization

The single quadrupole compact mass spectrometer (cms) by Advion offers polarity switching in a single analysis for a greater range of detectable ions.

The Bruker MultiMode 8 AFM provides nano-meter surface topography imaging and pico-Newtown surface force measurement in air.

SEM tabletop microscope operating at 5 and 15 kV equipped with energy dispersive X-ray spectroscopy (EDS) detector.

The UV confocal Raman microscope is an advanced method to acquire chemical and phase compositions, texture, phase transitions, residual stresses and structural information non-destructively...

X-ray diffraction is a non-destructive technique used for the identification and quantification of the crystalline phase composition of powdered, bulk, and thin film samples

An instrument for determining caloric effects (transformation temperatures and enthalpies) and mass change at the same time.

The TECAN SPARK 10M is a multifunctional microplate reader equipped with a high-speed monochromator (HSM), allowing full absorbance spectrum scan in less than 5...

Ellipsometry is based on the measurement of the light polarization change upon reflection from a sample surface or interface.

A technique based on the inelastic scattering of monochromatic light from a laser source, providing chemical information of a sample.

The optical microscope is a standard modular microscope that permits sample observation and images acquisition and analysis through the Cell A software.

The ergonomic and modular Leica M80 routine stereo microscope with ESD design, large field of view, increased depth of focus and improved resolution easily...

High resolution field emission SEM microscope operating at up to 30 kV equipped with energy dispersive X-ray spectroscopy (EDS) detector, and reaching resolutions down...