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Wishlist

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Countries/Institutes
Countries/Institutes
Transnational Access Activity
Transnational Access Activity
Zeiss Auriga combines a high-resolution SEM for imaging materials and devices at nanoscale with a FIB column enabling precise milling.
Software for modelling thin-film solar cells with arbitrary device geometry.
A suite of tools by SILVACO™ for TCAD simulation of semiconductor technologies.
Mechanical peel testing machine Mark-10 with a ESM303 test stand with a series 5 force gauge and G1008 film and paper grip.
Two available climate chambers for controlled humidity and temperature experimentation.
Customizable measurement setups for the characterization of electrochromic displays
Advanced equipment for electrical characterization of materials, components, devices and circuits in ESD protected area (EPA).
Plotter that uses a knife to cut materials such as paper and plastic films for e.g. prototype or sample preparation purposes.
The equipment is used to cut or engrave materials such as wood, metal, and polymer.
Manual pick and place station and equipment for surface mounting of devices. 
Equipment for surface mounting device, SMD. Mount components on the printed circuit board. The pick head can apply both heat and pressure.
The nRad line of slot die coater is based on nTact’s  patented technology.

Access to design, modelling and simulation facilities will address projects oriented on high-resolution multiscale process simulations, as well as machine learning artificial intelligence based approaches giving insight and guidelines for novel material growth, functional design, and fabrication.

Access to materials synthesis and characterization facilities will be devoted to faster, cheaper and more sustainable ink/ pastes formulation with improved quality control dedicated to specific application scopes.

Access to prototypes fabrication facilities will focus on highly efficient production of sophisticated and complex flexible large-area printed electronics and photonics systems with high conformability and integrability dedicated to specific application needs allowing upscaling and technology transfer processes towards industrial production.

Access to demonstrators’ test, validation and characterization aims to establish performance and stability tests under industrial protocols in simulated and real conditions for various types of devices using a wide variety of available characterization methods aiming at specifying universal metrology protocols. Besides, it will offer solutions on encapsulation processes and investigations of ageing processes while developing automated testing setups to accelerate device evaluation.